MANISH NANDY,NAIMISH NANDA,DR. ELIZABETH JACOB
DOI: https://doi.org/This paper describes a twofold psychometric study on the impact of grit and engineering mindset on the academic achievement of undergraduate engineering students. Grit, explicitly the perseverance and passion for a defined long–term goal, and the engineering mindset encompassing an iterative and failure-tolerant approach to problem-solving, are both vital yet underexplored domains within the field of engineering education. With the application of recognized instruments, ranging from the Short Grit Scale (Grit-S) to the Engineering Mindset Inventory (EMI) to the application of SEM and IRT, the study aimed to examine the constructs’ dimensionality, relationships, and predictive value.
Within the scope of this study, data from 180 students in various engineering disciplines were compiled and examined for consistency, structure, and performance at the item level. SEM results showed a notable positive correlation of grit and the engineering mindset, suggesting the constructs bolster one another in the enhancement of student engagement, resilience, and performance. IRT also identified high-informative items, particularly those related to grit. Group comparison analysis revealed shift variation and gender differences, but little variation between disciplines, suggesting broad relevance of the constructs.
The results are significant from an educational perspective; they suggest that grit and mindset should be developed in conjunction with one’s technical skills and competencies to ensure comprehensive and balanced growth as a learner. Reflective evaluations and iterative design challenges along with failure-positive feedback systems can enhance these learner traits. This study offers a valuable contribution by affirming the interplay between cognitive grit and mindset fluidity as a significant foundation for developing resilient and innovative, as well as self-reflective engineering practitioners trained to tackle multifaceted problems of the 21st century.